Equipment

1._High-resolution Fourier-spectrometer IFS 125HR ("Bruker", Germany)

Purpose - high-precision spectral measurements in a wide range of wavelengths (infrared, visible area and near ultraviolet). Spectral range - 5-50000 cm^-1, spectral resolution limit - 0.001 cm^-1, wavenumber accuracy - 10^-6 cm^-1.

2._Laser femtonanooptical spectrometric complex with femtosecond atomic and molecular resolution (equipment by "Spectra Physics", "Avesta Project", "Oplaz Technologies", "KDP", "Hamamatsu", "Light Conversion", "Standa" acquired in 1999-2006)

Purpose - measurements of spectral-kinetic characteristics of samples by femtosecond pulses "excitement - sensing" method, laser photochemistry and nanooptical research, study of surface nanostructures and their characterization with femtosecond time resolution and nanometer spatial resolution. Laser pulse duration - 30 fs, pulse energy - up to 2.4 mJ, pulse repetition rate - 1 kHz, spectral range - 240-11000 nm and 0.3-3 THz, spectromicroscope mode resolution - 5 nm.

3._Unique laser photoelectron projection spectromicroscope for studies of solids surface structure with subwavelength (5 nm) spatial resolution (vacuum chamber and registration system)

Purpose - photoemission study of the characteristics of the samples with a spatial resolution up to a few nanometers. Laser excitation spectral range - 0.26 - 2 microns. Magnification of the projection photoelectron microscope - 10⁴ ÷ 10⁶. The setup allows measurements with a low stream of photoelectrons (detection sensitivity is of ~ 10 electrons).

4._High-resolution Fourier spectrometer DA3.002 ("ABB-BOMEM", Canada)

Year of manufacture – 1989, renovated in 2003-2006.

Purpose - high-precision spectral measurements in a wide range of wavelengths (infrared and visible areas). Spectral range - 10-20000 cm^-1, spectral resolution limit - 0.004 cm^-1, wavenumber accuracy - 0,002 cm^-1.

5._Fourier spectrometer IFS 66 v / s ("Bruker", Germany)

Year of manufacture – 1998, renovated in 2003.

Purpose – measurements of transmittance and reflectance spectra of solid, liquid and gaseous substances. Spectral range - 50-7500 cm^-1, spectral resolution limit - 0.25 cm^-1, wavenumber accuracy - 0.01 cm^-1.

6._Raman-Fourier spectrometer RFS 100 / s ("Bruker", Germany)

Year of manufacture - 2002.

Purpose - registration of Raman spectra in the near-IR region at 1.06 pm laser excitation. Spectral range - from -2000 to 3500 cm^-1, notch filter transmission region: -2000, -100, 70, and 3500 cm-1, spectral resolution limit - 0.7 cm^-1, wavenumber accuracy - 0.4 cm^-1.

7._Chromatography-mass spectrometer Clarus 500 ("Perkin-Elmer Intern. CV", Switzerland)

Year of manufacture - 2004.

Purpose - highly sensitive measurement of masses of products of chemical reactions initiated by ultrashort laser pulses. Sensitivity - 100 pg, mass range - 1200 Dalton, dynamic range – 10⁵.

8._Circular dichroism spectrometer (dichrometer) SKD-2MUFISAN (Custom-built in ISAN)

Purpose - circular dichroism spectra measurements and determining the concentration of biologically active substances and nanoparticles in liquids. Operating range - 190-800 nm, minimum detectable circular dichroism - 10^-6 (ΔA / A), limits of biologically active compounds detection 10^-7 ÷ 10^-14 M / L.

9._Unique measurement system for studies of ultrafast processes in condensed matter by coherent/incoherent photon echo in a wide range of low temperatures and external pressures with temporal super-resolution.

10._Time-of-flight mass spectrometer of photochemical and photophysical processes induced in molecular and cluster beams with femtosecond time resolution.

11._Nanostructure microscopy setup for ISO class 5 nanostructures studies by scanning probe and inverted optical microscopy in clean room conditions.

12._Universal luminescent microscope - high resolution spectrometer joined with atomic-force microscope.

Purposes: detection and spectroscopy of single quantum objects (organic molecules, semiconductor and dielectric quantum dots, nanocrystals); near-field and optical far-field nanodiagnostics of condensed matter.

13._Spectrometers for absorption, transmission and reflection spectra (double-beam spectrophotometer Specord 250 on the left, scanning monochromator-spectrograph MS2004 on the right).

14._Unique measurement system based on FOG-2 system by “KDP” company for studies of the dynamics of luminescence in condensed matter in a wide range of low temperatures with temporal super-resolution.

15._Unique technological setup of atomic nanolithography for producing nanostructures with a minimum element size less than 30 nm and thin films of semiconductor electronics materials at ultra-high vacuum conditions in the clean room of class ISO 5.